The NANO & PICO CHARACTERIZATION LAB at the California NanoSystems Institute (CNSI) at the University of California, Los Angeles (UCLA) provides an unprecedented collection of nano-scale surface analysis instrumentation in a single, multi-user facility. By combining multiple modes of surface analysis, this facility enables thorough investigation of the vast array of physical, chemical and electrical properties necessary for complete study of an experimental system and developing nanotechnologies. The Nano & Pico Characterization Lab provides both state-of-the-art microscopic techniques to visualize surfaces, adsorbates, nanostructures and devices at the atomic and molecular scale as well as a unique opportunity for researchers to gain insight into local properties under a wide range of experimental conditions.

Scanning Probe Microscopy (SPM) differs from conventional microscopic techniques that use light or beams of charged particles. SPM systems rely upon a unique tactile sensing of the surface using atomically sharp tips that literally "feel" atoms, molecules and nanostructures. Due to this direct, near-field interaction, SPM systems are able to probe local properties on the atomic scale including friction, electrical charge and local magnetism. In addition, the capacity to apply controlled forces enables quantitative measurement of nanomechanical properties with single molecule sensitivity such as intermolecular binding, unwinding or conformational changes and stiffness/adhesion on the soft surfaces of polymers, cells and biomaterials. SPM systems operate in a diverse range of environments, including temperatures below 4°K (liquid Helium) up to 1273°K and pressures ranging from ultrahigh vacuum (UHV) to atmospheric and liquid environments (including biofluids and electrolytes). The Nano & Pico Characterization Lab encompasses SPM imaging under all these environmental conditions. It is a cornerstone for developing new nanotechnology products and performing nanoscience research.

LEFT: Magnified MFM images of individual quantum dots taken acquired on the Bruker Dimension 5000 showing magnetic contrast inversion within a single Mn0:05Ge0:95 quantum dot by applying opposite magnetization to the tip. From Xiu, F. et al, Nature Materials 2010. RIGHT: Combined SEM and AFM image of a large, single, chemically converted graphene sheet acquired on the Bruker Dimension 5000. From Tung, V. C. et al. Nature Nanotechnology 2008.

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***OPEN POSITION***--Postdoctoral Scholar--the Gimzewski Group and NPC Lab are currently looking for motivated postdoctoral researchers with experience in UHV AFM/STM to participate in ongoing collaborative projects including: inorganic carbon materials, atom switch/memristors and catalysis. Interested parties should send their CV, cover letter and research interests to gimadmin@chem.ucla.edu.

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